Patent · US Expired

Semiconductor and process of fabrication thereof

US4855798A · kind A · utility

42Cited by
3References
15Claims
0Family size

Assignee

Inventors

Key dates

Filing dateDec 13, 1988
Grant dateAug 8, 1989
Priority date
Expiry dateDec 13, 2008

Classification

  • Technology area (CPC Y)Emerging Cross-Sectional Technologies
  • CPC primaryY10S257/915
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

A semiconductor device having a salicide (self-aligned silicide) configuration and operable as, for example, a dynamic RAM device is fabricated by preparing a semiconductor substrate, forming a layer of silicon in, on or over the semiconductor substrate, forming a layer of a metal on the layer of silicon, the metal silicide layer having a surface portion, and heating the resultant structure in the presence of a reaction ambient containing nitride for forming on the layer of silicon a layer of a metal silicide having a surface portion and nitriding the surface portion to form a nitride layer consisting of a nitride of said metal silicide.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.