Patent · US Expired

Adjustable echelle spectrometer arrangement and method for its adjustment

US4856898A · kind A · utility

5Cited by

2References

6Claims

0Family size

Assignee

Jenoptik Jena GmbH · DE

Inventors

Helmut Becker-Ross · Berlin, DE
Stefan Florek · Berlin, DE
Felix Kerstan · Jena, DE
Guenther Moebius · Jena, DE
Horst Sanders · Teltow, DE

Key dates

Filing date	Mar 11, 1988
Grant date	Aug 15, 1989
Priority date	—
Expiry date	Mar 11, 2008

Classification

Technology area (CPC G)Physics
CPC primaryG01J2003/1208
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

An adjustable Echelle spectrometer arrangement which can be used in single- and multi-element analysis by the emission or absorption of optical radiation. To compensate all the manufacturing and setup errors, the only arrangements present are those to change the height of the entry slit arrangement above the base plate and to rotate the dispersion prism about a first axis, approximately parallel to its roof edge, and about a second axis, that is vertical thereto. This compensates for the effect of errors associated with component and setup parameters which results from greater tolerances, without impairing mechanical and thermal stability and imaging quality.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.