Patent · US Expired

Method and apparatus for optical alignment of semiconductor by using a hologram

US4862008A · kind A · utility

15Cited by
4References
40Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJun 29, 1988
Grant dateAug 29, 1989
Priority date
Expiry dateJun 29, 2008

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG03F9/70
  • WIPO fieldOptics
  • WIPO sectorInstruments

Abstract

A wafer is aligned by using an alignment light having a longer wavelength than an exposure light. Exposure and alignment are effected through a common reduction lens. A wavefront aberration caused by the use of the long wavelength alignment light is compensated by a hologram. Thus, an alignment precision is improved without exposing a resist layer to a light.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.