Test circuit arrangement for a communication network and test method using same

US4881229A · kind A · utility

Assignee

• Alcatel N.V. · NL

Inventors

• Gunter Kaltbeitzel · Schwieberdingen, DE
• Michael Klein · Schenefeld, DE
• Martin Renner · Liptingen, DE
• Joachim Wolk · Besigheim, DE

Key dates

• Filing date: Oct 21, 1987
• Grant date: Nov 14, 1989
• Expiry date: Oct 21, 2007

Classification

• Technology area (CPC H): Electricity
• CPC primary: H04Q11/0478
• WIPO field: Telecommunications
• WIPO sector: Electrical engineering

Abstract

A built-in test-signal generator (TG) and a built-in error-detection circuit (PE) independent of the test-signal generator are provided in a novel circuit arrangement. In response to an external stimulus, a signal path can be opened at a given point, and the signal from the test-signal generator (TG) can be injected. The signal taken from another, likewise externally selectable point of the signal path is checked in the error-detection circuit (PE); the result is fed out. Such a circuit arrangement is used to advantage where many like circuit arrangements are united in a broadband switching network consisting of a plurality of broadband switching modules. Since the test-signal generators and the error-detection circuits are independent of each other, systems tests can be performed without having to form any additional testing paths. Such a circuit arrangement also facilitates the testing of large-scale-integrated circuits already on the wafer, because no high-frequency test signals have to be applied and taken off.