Patent · US Expired

Method and circuit configuration of the parallel input of data into a semiconductor memory

US4885748A · kind A · utility

13Cited by

2References

13Claims

0Family size

Assignee

Siemens Aktiengesellschaft · DE

Inventors

Kurt Hoffmann · Taufkirchen, DE
Hans-Dieter Oberle · Puchheim, DE
Rainer Kraus · Hersbruck, DE
Oskar Kowarik · Grafing, DE
Manfred Paul · Nackenheim, DE

Key dates

Filing date	Mar 16, 1988
Grant date	Dec 5, 1989
Priority date	—
Expiry date	Mar 16, 2008

Classification

Technology area (CPC G)Physics
CPC primaryG11C29/34
WIPO fieldComputer technology
WIPO sectorElectrical engineering

Abstract

A method and circuit configuration for the parallel input of data items in the form of a test pattern into a block of a semiconductor memory having a plurality of storage cells. For test purposes, data items are simultaneously input in parallel into the storage cells.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.