Rainer Kraus
14Patents
8h-index
5Co-inventors
57Inventor score
Filing activity: Jul 17, 1987 → Oct 12, 1995
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US5276643A | Integrated semiconductor circuit | Physics | 399 | Expired |
| US5184326A | Integrated semiconductor memory of the dram type and method for testing the same | Physics | 26 | Expired |
| US5229710A | CMOS band gap reference circuit | Electricity | 21 | Expired |
| US4956819A | Circuit configuration and a method of testing storage cells | Electricity | 15 | Expired |
| US4922134A | Testable redundancy decoder of an integrated semiconductor memory | Physics | 15 | Expired |
| US4906994A | Multi-stage integrated decoder device | Physics | 14 | Expired |
| US4885748A | Method and circuit configuration of the parallel input of data into a semiconductor memory | Physics | 13 | Expired |
| US4855621A | Multi-stage, integrated decoder device having redundancy test enable | Physics | 10 | Expired |
| US4896322A | Circuit configuration and a method for the testing of storage cells | Physics | 8 | Expired |
| US4803386A | Digital amplifier configuration in integrated circuits | Physics | 8 | Expired |
| US5030861A | Gate circuit having MOS transistors | Electricity | 7 | Expired |
| US4841180A | Integrable evaluating circuit | Physics | 2 | Expired |
| US5253209A | Integrated semiconductor memory | Physics | 2 | Expired |
| USRE36061E | Integrated semiconductor memory | General | 0 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.