Patent · US Expired

Method and product for fabricating a resonant-bridge microaccelerometer

US4893509A · kind A · utility

114Cited by
2References
14Claims
0Family size

Assignee

Inventors

Key dates

Filing dateDec 27, 1988
Grant dateJan 16, 1990
Priority date
Expiry dateDec 27, 2008

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01P2015/0842
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A resonant bridge microaccelerometer is formed using patterned Silicon-on-Insulator (SOI) material. A buried layer is formed in the silicon substrate using preferably oxygen ion implanting techniques. A predetermined proof mass is subsequently formed by selective deposition of an appropriate material on an epitaxially grown layer of silicon generally over the buried layer. The buried layer is subsequently removed by a hydrofluoric acid etch, thereby forming a gap generally everywhere therebetween the proof mass and the supporting silicon substrate, and delineating the resonant microbridges within the microaccelerometer.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.