Patent · US Expired

Nonvolatile memory cell for eeprom including a floating gate to drain tunnel area positioned away from the channel region to prevent trapping of electrons in the gate oxide during cell erase

US4894802A · kind A · utility

21Cited by
3References
3Claims
0Family size

Assignee

Inventors

Key dates

Filing dateFeb 2, 1988
Grant dateJan 16, 1990
Priority date
Expiry dateFeb 2, 2008

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH10D30/685

Abstract

Disclosed is a nonvolatile memory cell which utilizes a tunnel window to discharge the floating gate at a location spacially displaced from the program path for the cell. Also disclosed is a process for making such a memory cell.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.