Patent · US Expired

Nonvolatile semiconductor memory device and a writing method therefor

US4903236A · kind A · utility

75Cited by
2References
18Claims
0Family size

Assignee

Inventors

Key dates

Filing dateFeb 16, 1988
Grant dateFeb 20, 1990
Priority date
Expiry dateFeb 16, 2008

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG11C16/10
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

In an erase mode, a high DC voltage Vpp is applied to all of the word lines and zero volt is applied to all of the bit lines, whereby the contents of all of the memory transistors are simultaneously erased. In a write mode, which constitutes an essential feature of the present invention, zero volt is applied to a selected word line and the high DC voltage Vpp is applied to a selected bit line, with an intermediate voltage 1/2.Vpp being applied to the other word lines and bit lines. Thus, by electron tunneling, data is written in a memory transistor located at a point of intersection between the selected word line and the selected bit line.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.