Etching metal films with complexing chloride plasma
US4919750A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Apr 24, 1989 |
| Grant date | Apr 24, 1990 |
| Priority date | — |
| Expiry date | Apr 24, 2009 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01L21/32136
- WIPO fieldSurface technology, coating
- WIPO sectorChemistry
Abstract
A method for dry etching metals that form low volatility chlordes, in which Z-Cl reaction products are controllably introduced into a conventional Cl-based plasma independent of the workpiece. The Z-Cl products (e.g., AlCl.sub.3, GaCl.sub.3, etc.) are metal chlorides that have both electron acceptor and chloride donor properties. Thus, metals M (e.g., cobalt, copper and nickel) that usually produce low volatility chlorides can be controllably complexed to form high volatility Z.sub.x Cl.sub.y M.sub.z reaction products.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.