Probe for measuring workpieces
US4934065A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Jan 11, 1989 |
| Grant date | Jun 19, 1990 |
| Priority date | — |
| Expiry date | Jan 11, 2009 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01B7/012
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A contact-sensing probe for measuring workpieces includes a body (16) for attachment to a machine and a workpiece contacting stylus (22) carried by a stylus holder (24) which is mounted within the body for movmeent relative thereto from a rest position to a displaced position when the stylus contacts the workpiece. Sensors are provided for sensing workpiece contact by the stylus. The sensors comprise a plurality of strain gauges (46) mounted on pillars (44) connecting two parts (36A,36B) of a support structure which supports the stylus holder on the body. The strain gauges are mounted with their principal axes lying at an angle to the axes of the pillars, and by optimizing the numbers, positions and dimensions of the pillars together with the angles of the strain gauges, high sensitivity can be achieved with minimum risk of false signals due to probe vibration, while at the same time minimizing the variation in pre-travel of the stylus.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.