Device for the investigation of highly resolved partial spectra of an echelle spectrum

US4940325A · kind A · utility

Assignee

• Akademie der Wissenchaften der DDR · DE

Inventors

• Helmut Becker-Ross · Berlin, DE
• Stefan Florek · Berlin, DE
• Reinhard Tischendorf · Berlin, DE
• Klaus-Eberhard Engel · Frankfurt (Oder), DE
• Wolf-Ekkehard Matzke · Geising, DE
• Susanne Engel · Frankfurt (Oder), DE

Key dates

• Filing date: Mar 8, 1989
• Grant date: Jul 10, 1990
• Expiry date: Mar 8, 2009

Classification

• Technology area (CPC G): Physics
• CPC primary: G01J3/2803
• WIPO field: Measurement
• WIPO sector: Instruments

Abstract

The invention refers to a device for investigating highly resolved partial spectra of an echelle spectrum, being applicable to the simultaneous determination of the intensities of different spectral elements of a radiation spectrum produced by an echelle spectrometer. The device consists of a position-resolving photoelectric detector including several photosensors arranged on an IC chip, where said photosensors are arranged on the chip surface discretely at the positions of preselected spectral lines, each of the photosensors consisting of a CCD sensor row and a logic circuit which, depending on activation levels, enables supply potentials and clock signals to be connected and output signals to be transferred to a common output signal line; the areas of the individual sensor elements of the CCD sensor rows being matched to the spectral elements of the echelle spectrum and extending successively in the direction of dispersion of the echelle grating; the total number of sensor elements of all CCD sensor rows on the chip being smaller than the number of spectral elements in the echelle spectrum; and a digital logic circuit enabling, by means of the activation levels managed by it, the…