Patent · US Expired

Thin film semiconductor device and method of fabricating the same

US4943837A · kind A · utility

107Cited by
2References
11Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMar 10, 1988
Grant dateJul 24, 1990
Priority date
Expiry dateMar 10, 2008

Classification

  • Technology area (CPC Y)Emerging Cross-Sectional Technologies
  • CPC primaryY10S438/958

Abstract

A thin film transistor and a method of fabricating the transistor are disclosed. The gate electrode of this thin film transistor is made small in thickness so that active hydrogen for hydrogenating passivation can penetrate in a surface layer of channel region having substantially uniform thickness, through the gate electrode. Thus, hydrogenation can be effectively carried out for the thin film transistor, independently of the length of a channel formed in the transistor.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.