Built-in self test method for application specific integrated circuit libraries
US4949341A · kind A · utility
17Cited by
8References
21Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Oct 28, 1988 |
| Grant date | Aug 14, 1990 |
| Priority date | — |
| Expiry date | Oct 28, 2008 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/318516
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A design and method of exhaustively verifying the boolean functionality of both combinational and sequential cells for Application Specific Integrted Circuit gate array and standard cell libraries is provided. A single integrated circuit includes a plurality of cells or macros from the library. A Gray code generator provides a plurality of Gray code signals to the cells in response to a binary counter. The binary and Gray code signals stimulate each state of each cell. A multiplexed output indicates the functionality of each state.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.