Tomas Colunga
4Patents
4h-index
4Co-inventors
43Inventor score
Filing activity: Oct 28, 1988 → Apr 29, 2005
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US7322000B2 | Methods and apparatus for extending semiconductor chip testing with boundary scan registers | Physics | 28 | Expired |
| US4949341A | Built-in self test method for application specific integrated circuit libraries | Physics | 17 | Expired |
| US5199035A | Logic circuit for reliability and yield enhancement | Physics | 10 | Expired |
| US7272767B2 | Methods and apparatus for incorporating IDDQ testing into logic BIST | Physics | 6 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.