Interferometer with thin absorbing beam equalizing pellicle
US4955719A · kind A · utility
8Cited by
2References
14Claims
0Family size
Assignee
Inventor
Key dates
| Filing date | Dec 9, 1988 |
| Grant date | Sep 11, 1990 |
| Priority date | — |
| Expiry date | Dec 9, 2008 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01B9/02057
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An interferometer includes a thin, absorbing pellicle in the path of a test beam to attenuate the test beam so that its intensity is approximately equal to the intensity of a reference beam. The pellicle reflects less than about six percent of the test beam, thereby avoiding spurious reflections that produce spurious fringes.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.