Patent · US Expired

Test fixture for microstrip assemblies

US4961050A · kind A · utility

18Cited by
5References
36Claims
0Family size

Assignee

Inventors

Key dates

Filing dateFeb 10, 1989
Grant dateOct 2, 1990
Priority date
Expiry dateFeb 10, 2009

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01R1/04
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A test fixture for testing microstrip assemblies and similar electronic circuit components and assemblies under application of high-frequency signals introduced through launchers whose positions are adjustable in the test fixture to accommodate circuit assemblies of different sizes and different geometry. An easily operated rapid connector positioning mechanism moves connectors which complete electrical connection between outer conductors of the launchers and a ground plane conductor of a microstrip assembly. The connectors also lift the microstrip assembly and support it while electrical connection is completed, without the need for a carrier beneath the test assembly. A lid is moved in coordination with operation of the connector positioning mechanism to provide electrical contact to a third point on the upper face of a circuit assembly to be tested.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.