Cascade Microtech, Inc.
🏢 View company profile →248Patents
106Active
248Granted
49Portfolio score
Filing activity: Apr 30, 1984 → Apr 8, 2016 · 82 expiring within 5 years
Most-cited patents
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6549106B2 | Waveguide with adjustable backshort | Electricity | 332 | Expired |
| US4697143A | Wafer probe | Physics | 213 | Expired |
| US5506515A | High-frequency probe tip assembly | Physics | 165 | Expired |
| US5565788A | Coaxial wafer probe with tip shielding | Physics | 151 | Expired |
| US5610529A | Probe station having conductive coating added to thermal chuck insulator | Physics | 142 | Expired |
| US5266889A | Wafer probe station with integrated environment control enclosure | Electricity | 141 | Expired |
| US5729150A | Low-current probe card with reduced triboelectric current generating cables | Physics | 141 | Expired |
| US5914613A | Membrane probing system with local contact scrub | Physics | 130 | Expired |
| US4849689A | Microwave wafer probe having replaceable probe tip | Physics | 129 | Expired |
| US4827211A | Wafer probe | Physics | 128 | Expired |
| US5457398A | Wafer probe station having full guarding | Electricity | 126 | Expired |
| US5345170A | Wafer probe station having integrated guarding, Kelvin connection and shielding systems | Electricity | 122 | Expired |
| US6137302A | Low-current probe card with reduced triboelectric current generating cables | Physics | 115 | Expired |
| US5045781A | High-frequency active probe having replaceable contact needles | Physics | 111 | Expired |
| US5101453A | Fiber optic wafer probe | Physics | 106 | Expired |
| US4858160A | System for setting reference reactance for vector corrected measurements | Physics | 100 | Expired |
| US6724205B1 | Probe for combined signals | Physics | 99 | Expired |
| US7009383B2 | Wafer probe station having environment control enclosure | Physics | 96 | Expired |
| US6806724B2 | Probe for combined signals | Physics | 96 | Expired |
| US6256882A | Membrane probing system | Emerging Cross-Sectional Technologies | 94 | Expired |
| US4764723A | Wafer probe | Physics | 93 | Expired |
| US6232788A | Wafer probe station for low-current measurements | Electricity | 92 | Expired |
| US6232789A | Probe holder for low current measurements | Physics | 88 | Expired |
| US6578264B1 | Method for constructing a membrane probe using a depression | Emerging Cross-Sectional Technologies | 85 | Expired |
| US7187188B2 | Chuck with integrated wafer support | Physics | 85 | Expired |
Source: USPTO / EPO open patent data. Counts and citation impact are objective bibliographic measures.