Patent · US Expired

Connector assembly for chip testing

US4975079A · kind A · utility

212Cited by
3References
10Claims
0Family size

Assignee

Inventors

Key dates

Filing dateFeb 23, 1990
Grant dateDec 4, 1990
Priority date
Expiry dateFeb 23, 2010

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01R2201/20
  • WIPO fieldElectrical machinery, apparatus, energy
  • WIPO sectorElectrical engineering

Abstract

An electrical connector is described for making contact with a plurality of convex and deformable contacts on an electronic device. The electrical connector comprises a substrate having a plurality of conductors which extend above its surface. A polymeric material is disposed on the surface of the substrate and has openings which expose the conductors, each opening sized to receive one of the convex, deformable contacts, and to enable electrical connection between the exposed conductors and the deformable contacts. A mechanism is provided for urging the deformable contacts on the electronic device against the exposed conductors. The mechanism exerts sufficient force between the device and the conductors to cause some deformation of the convex contact areas by the conductors.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.