Apparatus and method for circuit board testing
US4977370A · kind A · utility
Assignee
Inventor
Key dates
| Filing date | Dec 6, 1988 |
| Grant date | Dec 11, 1990 |
| Priority date | — |
| Expiry date | Dec 6, 2008 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R1/07378
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A test fixture useful in testing printed circuit boards requires wire-wrapping only on a single side of a single board and is characterized by a reduced signal path length. The test fixture is provided with a translator device for conducting signals between system contact points in a testing system and contact points corresponding to selected locations on a unit-under-test ("UUT"). The translator device includes extended system pins, non-extended system pins, UUT pins and through-posts. On one side of the translator board, the UUT pins are wire-wrapped to the extended system pins wherever space allows, and otherwise to the through pins. The through pins make electrical contact to the non-extended system pins by means of conductive pads disposed on the other side of the translator board. A method of fabricating such a test fixture includes the step of computing optimal UUT and through-post locations.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.