Patent · US Expired

Particle beam measuring method for non-contact testing of interconnect networks

US4985681A · kind A · utility

33Cited by
10References
16Claims
0Family size

Assignee

Inventors

Key dates

Filing dateDec 27, 1985
Grant dateJan 15, 1991
Priority date
Expiry dateDec 27, 2005

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01R31/50
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

For testing an interconnect network for shorts and interruptions, a point of the network to be tested is charged with a particle beam. Subsequently, a potential at least one further contact point is read with the same particle beam and an unaltered primary energy. An identification of potential occurs by documenting the secondary electrons triggered at the contact points. In order to avoid a disturbing change of potential during the measuring phase, the measuring time is only a fraction of the time for charging the network.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.