Particle beam measuring method for non-contact testing of interconnect networks
US4985681A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Dec 27, 1985 |
| Grant date | Jan 15, 1991 |
| Priority date | — |
| Expiry date | Dec 27, 2005 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/50
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
For testing an interconnect network for shorts and interruptions, a point of the network to be tested is charged with a particle beam. Subsequently, a potential at least one further contact point is read with the same particle beam and an unaltered primary energy. An identification of potential occurs by documenting the secondary electrons triggered at the contact points. In order to avoid a disturbing change of potential during the measuring phase, the measuring time is only a fraction of the time for charging the network.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.