ACVD (chemical vapor deposition) method for selectively depositing metal on a substrate
US4994301A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Jun 30, 1987 |
| Grant date | Feb 19, 1991 |
| Priority date | — |
| Expiry date | Jun 30, 2007 |
Classification
- Technology area (CPC Y)Emerging Cross-Sectional Technologies
- CPC primaryY10S427/101
- WIPO fieldSurface technology, coating
- WIPO sectorChemistry
Abstract
A wafer, in which at least one via hole is made in an insulating film formed on the substrate, and a first metallic film is formed in the via hole is prepared. The wafer is held in a wafer holder in a reaction chamber under reduced pressure. WF.sub.6 gas and H.sub.2 gas are introduced into the chamber and light from a heating lamp is directed onto the wafer, such that a difference in temperature is created between the insulating film and the first metallic film such that a second metallic film of W is formed only on the first metallic film in the chemical vapor deposition process. The temperature difference is due to the differences of the adsorption ratios of infrared light of the insulating film, the substrate and the first metallic film. The WF.sub.6 gas and H.sub.2 gas are made to flow in flat or sheet form substantially parallel to the surface of the wafer, and in inernt gas, such as Ar, is made to flow toward the surface of the wafer to control the flow of WF.sub.6 and H.sub.2 gas.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.