Patent · US Expired

Method and apparatus for etching semiconductor materials

US5002632A · kind A · utility

433Cited by
2References
11Claims
0Family size

Assignee

Inventors

Key dates

Filing dateNov 22, 1989
Grant dateMar 26, 1991
Priority date
Expiry dateNov 22, 2009

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L21/31116
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

An apparatus and method for the etching of semiconductor materials (14) is disclosed. The apparatus (10) includes a process chamber (12) having a remote generator (16) in fluid communication with the process chamber (12) for converting a noble gas (34) to a metastable gas (36). An etchant gas (40) is subsequently brought into the chamber (12) adjacent to the material (14), to mix and react with the metastable gas (36) at activation zone (38). The metastable gas (36) collides with the etchant gas (40) to cause the mixture to selectively etch the material 14.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.