Patent · US Expired

Semiconductor devices and a process for producing the same

US5028975A · kind A · utility

6Cited by
4References
61Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMay 23, 1990
Grant dateJul 2, 1991
Priority date
Expiry dateMay 23, 2010

Classification

  • Technology area (CPC Y)Emerging Cross-Sectional Technologies
  • CPC primaryY10S257/903
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

Disclosed is an MOSIC including a plurality of silicon gate type MOSFET's in which, after polycrystalline silicon wirings are formed simultaneously with polycrystalline silicon gates, the electrodes contacted with the source and drain regions are made of polycrystalline silicon so as to be connected to the polycrystalline silicon wirings, thereby to prevent the shallow pn junctions of the source and drain regions from being destroyed by the contacts and to provide a high degree of integration to one silicon chip.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.