Electrical test probe having rotational control of the probe shaft
US5032787A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Nov 3, 1989 |
| Grant date | Jul 16, 1991 |
| Priority date | — |
| Expiry date | Nov 3, 2009 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01R13/2421
- WIPO fieldElectrical machinery, apparatus, energy
- WIPO sectorElectrical engineering
Abstract
A test probe assembly includes a barrel having a hollow interior and a plunger which slides axially in the barrel. The plunger has an outer portion extending through an open end of the barrel, terminating in a contact tip outside the barrel for contact with a test point. In one embodiment, the plunger also has a hollow, elongated receptacle extending through the barrel. The receptacle has a geometric-shaped pilot hole, preferably square, spaced from the open end of the barrel. An elongated fixed guide member in the barrel extends through the pilot hole. The guide member extends through the interior of the barrel away from the pilot hole. The guide member has an outer surface of preferably square-shaped configuration engaging the pilot hole. A spring inside the barrel extends along the guide member and is biased against the internal end of the receptacle inside the barrel. Axial travel of the plunger into the barrel is against the bias of the spring. The square-shaped outer surface of the guide member, engaging the square pilot hole, controls rotational motion of the plunger as it travels along the guide member against the bias of the spring. In one embodiment, a helical configurati…
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.