Mark A. Swart
62Patents
20h-index
21Co-inventors
88Inventor score
Filing activity: Apr 14, 1986 → Jul 14, 2023
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US5408189A | Test fixture alignment system for printed circuit boards | Physics | 166 | Expired |
| US5389885A | Expandable diaphragm test modules and connectors | Electricity | 101 | Expired |
| US6066957A | Floating spring probe wireless test fixture | Electricity | 64 | Expired |
| US5447442A | Compliant electrical connectors | Electricity | 60 | Expired |
| US5289117A | Testing of integrated circuit devices on loaded printed circuit | Physics | 56 | Expired |
| US5049813A | Testing of integrated circuit devices on loaded printed circuit boards | Physics | 53 | Expired |
| US5321351A | Test fixture alignment system | Physics | 46 | Expired |
| US5641315A | Telescoping spring probe | Electricity | 46 | Expired |
| US5032787A | Electrical test probe having rotational control of the probe shaft | Electricity | 46 | Expired |
| US5493230A | Retention of test probes in translator fixtures | Physics | 46 | Expired |
| US5865641A | Solid spring electrical contacts for electrical connectors and probes | Electricity | 43 | Expired |
| US5045780A | Electrical test probe contact tip | Physics | 42 | Expired |
| US5252916A | Pneumatic test fixture with springless test probes | Electricity | 42 | Expired |
| US5180976A | Integrated circuit carrier having built-in circuit verification | Physics | 33 | Expired |
| US6084421A | Test socket | Physics | 31 | Expired |
| US5300881A | Test fixture | Physics | 26 | Expired |
| US5663655A | ESD protection for universal grid type test fixtures | Physics | 25 | Expired |
| US7862391B2 | Spring contact assembly | Emerging Cross-Sectional Technologies | 24 | Active |
| US5633598A | Translator fixture with module for expanding test points | Physics | 24 | Expired |
| US5801544A | Spring probe and method for biasing | Physics | 20 | Expired |
| US5450017A | Test fixture having translator for grid interface | Physics | 20 | Expired |
| US5391995A | Twisting electrical test probe with controlled pointing accuracy | Physics | 20 | Expired |
| US6025729A | Floating spring probe wireless test fixture | Electricity | 18 | Expired |
| US5270641A | Dual side access test fixture | Physics | 18 | Expired |
| US5247246A | Testing of integrated circuit devices on loaded printed circuit boards | Physics | 18 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.