Calculating AC chip performance using the LSSD scan path
US5039939A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Dec 29, 1988 |
| Grant date | Aug 13, 1991 |
| Priority date | — |
| Expiry date | Dec 29, 2008 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/31858
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Chip performance is measured using LSSD logic to propagate a signal through the LSSD scan path of the chip. The measurement data is compared to tabular data which is used to classify the AC chip performance. The use of the LSSD scan path provides an accurate overall measurement of an entire chip. The circuitry is internal to the system and does not require external test circuitry. No unique test patterns are required for a given chip design. The chip measurements can be made after installation of the chip in a field operational environment as well as during a manufacturing and testing environment. The chip measurements can be made by local execution of the testing or controlled from a remote location.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.