Patent · US Expired

Probe unit for an atomic probe microscope

US5041783A · kind A · utility

28Cited by
7References
17Claims
0Family size

Assignee

Inventors

Key dates

Filing dateFeb 5, 1990
Grant dateAug 20, 1991
Priority date
Expiry dateFeb 5, 2010

Classification

  • Technology area (CPC Y)Emerging Cross-Sectional Technologies
  • CPC primaryY10S977/861
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A probe unit includes a disk-like substrate made of transparent material, a transparent electrode coated on all over the substrate, and a metal wire whose sharp tip is projected vertically and upwardly from the center of the substrate through the transparent electrode. The metal wire is made of Pt-Ir, which incudes a sharp tip projected from the upper surface of the substrate and a stem embedded in a hole of the electrode and fixed to the electrode and substrate by conductive adhesive.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.