Tsugiko Takase
12Patents
11h-index
22Co-inventors
61Inventor score
Filing activity: Feb 5, 1990 → Oct 6, 1992
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US5289004A | Scanning probe microscope having cantilever and detecting sample characteristics by means of reflected sample examination light | Emerging Cross-Sectional Technologies | 93 | Expired |
| US5260824A | Atomic force microscope | Emerging Cross-Sectional Technologies | 86 | Expired |
| US5294790A | Probe unit for near-field optical scanning microscope | Emerging Cross-Sectional Technologies | 55 | Expired |
| US5138159A | Scanning tunneling microscope | Emerging Cross-Sectional Technologies | 51 | Expired |
| US5083022A | Scanning tunneling microscope | Emerging Cross-Sectional Technologies | 35 | Expired |
| US4987303A | Micro-displacement detector device, piezo-actuator provided with the micro-displacement detector device and scanning probe microscope provided with the piezo-actuator | Emerging Cross-Sectional Technologies | 30 | Expired |
| US5296704A | Scanning tunneling microscope | Emerging Cross-Sectional Technologies | 29 | Expired |
| US6127681A | Scanning tunnel microscope | Emerging Cross-Sectional Technologies | 29 | Expired |
| US5041783A | Probe unit for an atomic probe microscope | Emerging Cross-Sectional Technologies | 28 | Expired |
| US5059793A | Scanning tunneling microscope having proper servo control function | Emerging Cross-Sectional Technologies | 13 | Expired |
| US5136162A | Measuring device in a scanning probe microscope | Emerging Cross-Sectional Technologies | 12 | Expired |
| USD335888S | Probe for a scanning tunneling microscope | General | 1 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.