Electrical test probe contact tip
US5045780A · kind A · utility
Assignee
Inventor
Key dates
| Filing date | Dec 4, 1989 |
| Grant date | Sep 3, 1991 |
| Priority date | — |
| Expiry date | Dec 4, 2009 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R1/06722
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An electrical test probe comprises an outer barrel, and a plunger extending axially through the barrel and having an outer portion extending through an open end of the barrel and terminating in a contact tip outside the barrel for contact with a test point. The plunger is supported within the barrel by spring pressure for allowing spring biased relative axial motion between the plunger and the barrel. The plunger is rotatable about its axis during relative axial motion between the plunger and barrel against the bias of the spring so that rotation of the plunger causes enhanced contact between the probe and a test point on a circuit board under test. The contact tip comprises a head having a substantially continuous outer blade edge extending around a periphery of the head and positioned thereon to engage the test point on the board, and at least one further substantially continuous inner blade edge inside the outer blade edge and positioned preferably concentrically with respect to the outer blade edge also for contact with the test point on the board. The inner and outer blade edges are able to spin about the axis of the plunger during their contact with the test point without cau…
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.