Patent · US Expired

Alignment and exposure apparatus and method for manufacture of integrated circuits

US5050111A · kind A · utility

24Cited by
15References
7Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJun 25, 1990
Grant dateSep 17, 1991
Priority date
Expiry dateJun 25, 2010

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG03F9/7057
  • WIPO fieldOptics
  • WIPO sectorInstruments

Abstract

An alignment apparatus includes a first off-axis alignment optical system having a magnification, and a second off-axis alignment optical system having a magnification higher than that of the first off-axis alignment optical system, wherein the apparatus is operable in a global alignment mode using the second off-axis alignment optical system. In another aspect, an alignment apparatus includes a first off-axis alignment optical system having a magnification, a second off-axis alignment optical system having a magnification higher than that of the first off-axis alignment optical system, and a TTL alignment optical system, wherein the alignment apparatus is operable in a global alignment mode using the second off-axis alignment optical system and is operable in another global alignment mode using the TTL optical alignment system.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.