Method of testing control matrices for flat-panel displays
US5057775A · kind A · utility
22Cited by
5References
15Claims
0Family size
Assignee
Inventor
Key dates
| Filing date | May 4, 1990 |
| Grant date | Oct 15, 1991 |
| Priority date | — |
| Expiry date | May 4, 2010 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/316
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An AC signal source (26) in series with a variable DC source (34) drives a gate line of an LCD-display drive matrix (10), and current meters (28, 30, 32) monitor the resultant currents in the drain lines. By comparing the thus-measured transadmittance both with and without enabling values of the DC-source output, one can test the matrix (10) for defects.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.