Illuminance distribution measuring system
US5067811A · kind A · utility
20Cited by
3References
32Claims
0Family size
Assignee
Inventor
Key dates
| Filing date | Jun 25, 1990 |
| Grant date | Nov 26, 1991 |
| Priority date | — |
| Expiry date | Jun 25, 2010 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG03F7/70358
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An illuminance distribution measuring system which includes a two-dimensional (area) sensor array to be disposed on the surface being illuminated by a pulsed laser beam from a pulsed laser and a signal processor operable, in response to output signals of the sensor array, to detect the illuminance distribution on the surface being illuminated.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.