Apparatus and method for documenting faults in computing modules
US5068851A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Aug 1, 1989 |
| Grant date | Nov 26, 1991 |
| Priority date | — |
| Expiry date | Aug 1, 2009 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F11/16
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
Method and apparatus for testing the operation of modules for use in a fault tolerant computing system that consists of two distinct computing zones. Diagnostic testing is performed when the system is powered on, the modules being subjected to module, zone and, if both zones are available, system diagnostic tests. Indications of faults detected during diagnostic testing are stored in an EEPROM on each module. Such fault indications can be cleared in the field by correcting the fault condition and successfully rerunning the diagnostic test during which the fault was detected. Indications of operating system detected faults are also stored in each module EEPROM. However, such fault indications are not field clearable.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.