Patent · US Expired

Polyamide containing the hexafluoroisopropylidene group

US5077378A · kind A · utility

24Cited by
16References
6Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMay 21, 1990
Grant dateDec 31, 1991
Priority date
Expiry dateMay 21, 2010

Classification

  • Technology area (CPC C)Chemistry; Metallurgy
  • CPC primaryC08G69/32
  • WIPO fieldMacromolecular chemistry, polymers
  • WIPO sectorChemistry

Abstract

This invention is that of high temperature polyamides containing the hexafluoroisopropylidene group. The high temperature polyamides of the invention and photo or radiation sensitizers provide improved high temperature positive resists which can be developed in aqueous alkaline developer and thermally anneal to form heat resistant, polyoxazole relief structures suitable for use in microelectronic and printing applications. The positive photoresists of the invention have improved solubility in coating solvents and improved photospeed. The polyamides of the invention can be prepared by conventional condensation reactions; e.g. the condensation of a diamine and diacid chloride. In addition the polyamides of this invention provide high temperature protective coatings with superior adhesion properties in applications other than the photoresist area.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.