Electro-optic sampling system clock and stimulus pattern generator
US5095262A · kind A · utility
25Cited by
11References
24Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Sep 1, 1988 |
| Grant date | Mar 10, 1992 |
| Priority date | — |
| Expiry date | Sep 1, 2008 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/31922
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A high-speed electro-optic test system for testing high-speed electronic devices and integrated circuits is provided with a precision programmable reference clock source providing clock pulses for accurately timing a stimulus pattern in precise synchronism with optical sampling pulses. The clock source includes a frequency synthesizer having a programmed output frequency and precision delay features. The stimulus pattern clock frequency and pattern length can be programmed to facilitate maximum throughput for devices being tested in the electro-optic system.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.