PhotoDynamic Inc.
83Patents
24Active
83Granted
44Portfolio score
Filing activity: Sep 1, 1988 → Jan 20, 2021 · 12 expiring within 5 years
Most-cited patents
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US5917935A | Mura detection apparatus and method | Physics | 99 | Expired |
| US5764209A | Flat panel display inspection system | Physics | 80 | Expired |
| US5754678A | Substrate inspection apparatus and method | Emerging Cross-Sectional Technologies | 60 | Expired |
| US4983911A | Voltage imaging system using electro-optics | Physics | 58 | Expired |
| US4875006A | Ultra-high-speed digital test system using electro-optic signal sampling | Physics | 54 | Expired |
| US5432461A | Method of testing active matrix liquid crystal display substrates | Emerging Cross-Sectional Technologies | 54 | Expired |
| US4862075A | High frequency test head using electro-optics | Physics | 54 | Expired |
| US5504438A | Testing method for imaging defects in a liquid crystal display substrate | Physics | 49 | Expired |
| US5164565A | Laser-based system for material deposition and removal | Electricity | 49 | Expired |
| US5459410A | Method and apparatus for automatically inspecting and repairing an active matrix LCD panel | Emerging Cross-Sectional Technologies | 47 | Expired |
| US5235272A | Method and apparatus for automatically inspecting and repairing an active matrix LCD panel | Emerging Cross-Sectional Technologies | 46 | Expired |
| US5124635A | Voltage imaging system using electro-optics | Physics | 44 | Expired |
| US6154561A | Method and apparatus for detecting Mura defects | Physics | 43 | Expired |
| US5081687A | Method and apparatus for testing LCD panel array prior to shorting bar removal | Emerging Cross-Sectional Technologies | 40 | Expired |
| US5801824A | Large area defect monitor tool for manufacture of clean surfaces | Physics | 40 | Expired |
| US5790247A | Technique for determining defect positions in three dimensions in a transparent structure | Physics | 37 | Expired |
| US5285150A | Method and apparatus for testing LCD panel array | Physics | 33 | Expired |
| US5170127A | Capacitance imaging system using electro-optics | Physics | 33 | Expired |
| USRE37847E1 | Method and apparatus for testing LCD panel array prior to shorting bar removal | General | 33 | Expired |
| US5177437A | High-density optically-addressable circuit board probe panel and method for use | Physics | 32 | Expired |
| US6151153A | Modulator transfer process and assembly | Physics | 31 | Expired |
| US5175504A | Method and apparatus for automatically inspecting and repairing a simple matrix circuit panel | Electricity | 28 | Expired |
| US5465052A | Method of testing liquid crystal display substrates | Physics | 27 | Expired |
| US5543729A | Testing apparatus and connector for liquid crystal display substrates | Electricity | 26 | Expired |
| US5459409A | Testing device for liquid crystal display base plate | Physics | 25 | Expired |
Source: USPTO / EPO open patent data. Counts and citation impact are objective bibliographic measures.