Driver circuit for testing bi-directional transceiver semiconductor products
US5097144A · kind A · utility
4Cited by
11References
6Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Apr 30, 1990 |
| Grant date | Mar 17, 1992 |
| Priority date | — |
| Expiry date | Apr 30, 2010 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/2844
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A driver circuit is disclosed for use in testing bi-directional transceiver semiconductor products using a minimum of time and number of product accessing pins. The driver includes a pair of controllable amplitude current sources whose output currents are selectably switched into or partially away from the commonly connected emitters of a current switch. The current switch is energized by a variable voltage source and produces the output test voltage.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.