Dale E. Hoffman
11Patents
5h-index
21Co-inventors
66Inventor score
Filing activity: Apr 15, 1987 → Oct 14, 2014
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US5381421A | Per pin circuit test system having N-bit pin interface providing speed improvement with frequency multiplexing | Physics | 31 | Expired |
| US5013944A | Programmable delay line utilizing measured actual delays to provide a highly accurate delay | Electricity | 20 | Expired |
| US5127011A | Per-pin integrated circuit test system having n-bit interface | Physics | 14 | Expired |
| US6323050A | Method for evaluating decoupling capacitor placement for VLSI chips | Physics | 11 | Expired |
| US4924484A | High speed digital counter | Electricity | 5 | Expired |
| US6618843B2 | Method for evaluating decoupling capacitor placement for VLSI chips | Physics | 5 | Expired |
| US5097144A | Driver circuit for testing bi-directional transceiver semiconductor products | Physics | 4 | Expired |
| US6618844B2 | Method for evaluating decoupling capacitor placement for VLSI chips | Physics | 4 | Expired |
| US4779270A | Apparatus for reducing and maintaining constant overshoot in a high speed driver | Electricity | 1 | Expired |
| US9740980B2 | Performing sub-system attribute modification | Physics | 0 | Active |
| US9740981B2 | Performing sub-system attribute modification | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.