Compact temperature-compensated tube-type scanning probe with large scan range
US5103094A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | May 2, 1991 |
| Grant date | Apr 7, 1992 |
| Priority date | — |
| Expiry date | May 2, 2011 |
Classification
- Technology area (CPC Y)Emerging Cross-Sectional Technologies
- CPC primaryY10S977/872
- WIPO fieldElectrical machinery, apparatus, energy
- WIPO sectorElectrical engineering
Abstract
A scanning probe microscope includes a base, an inner piezoelectric tube, and an outer piezoelectric tube, with a first end of the outer piezoelectric tube connected to the base. A first end of the inner piezoelectric tube is rigidly connected to a second end of the outer piezoelectric tube. Thin inner conductors are disposed on the inner surfaces of the inner piezoelectric tube and the other piezoelectric tube, and quadrant conductors are disposed on the outer surfaces of the inner piezoelectric tube and the outer piezoelectric tube. Variable voltages are applied to the quadrant conductors of the outer piezoelectric tube and the inner piezoelectric tube and varied to cause lateral and axial movement of the second end of the outer piezoelectric tube and also to cause lateral and perpendicular movement of the second end of the inner piezoelectric tube relative to its first end. A probe having a tip is connected to the second end of the inner piezoelectric tube and scans the surface of a sample in response to the applied quadrant conductor voltages. A control system senses current or other parameter sensed by the tip of the probe and indicative of distance of the probe tip from the s…
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.