Patent · US Expired

Interconnect method for semiconductor devices

US5107321A · kind A · utility

24Cited by
12References
7Claims
0Family size

Assignee

Inventors

Key dates

Filing dateApr 2, 1990
Grant dateApr 21, 1992
Priority date
Expiry dateApr 2, 2010

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L2924/0002
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

A BiCMOS device is revealed. The BiCMOS device achieves improved performance through the use of wrap-around silicide contacts, improved MOS gate formation, the use of n- and p-type LDD's, the formation of very shallow base regions in bipolar transistors, and through separate implants for base regions of the bipolar transistors and source/drains of the MOSFETS.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.