Patent · US Expired

Anti-fuse structures and methods for making same

US5120679A · kind A · utility

108Cited by
10References
16Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJun 4, 1991
Grant dateJun 9, 1992
Priority date
Expiry dateJun 4, 2011

Classification

  • Technology area (CPC Y)Emerging Cross-Sectional Technologies
  • CPC primaryY10S148/055
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

An anti-fuse structure characterized by a substrate, an oxide layer formed over the substrate having an opening formed therein, an amorphous silicon material disposed within the opening and contacting the substrate, and oxide spacers lining the walls of a recess formed within the amorphous silicon. The spacers prevent failures of the anti-fuse structures by covering cusps formed in the amorphous silicon material. The method of the present invention forms the above-described anti-fuse structure and further solves the problem of removing unwanted spacer material from areas outside of the anti-fuse structure locations.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.