Voltage imaging system using electro-optics
US5124635A · kind A · utility
Assignee
Inventor
Key dates
| Filing date | Feb 13, 1991 |
| Grant date | Jun 23, 1992 |
| Priority date | — |
| Expiry date | Feb 13, 2011 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R15/241
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A two-dimensional image of the voltage distribution across a surface at a large plurality voltage test points of a panel under test is extracted by illuminating the surface with an input beam of optical energy through an electro-optic modulator wherein the modulator is disposed to allow longitudinal probing geometries such that a voltage differential on the surface of the panel under test causes a power modulation in the optical energy which can be observed through an area optical sensor (a camera) for use to directly produce a two-dimensional spatially-dependent power modulation image directly representative of the spatially corresponding differential voltage state on the surface of the panel under test. Surface cross-talk is minimized by placing the face of the modulator closer to the panel under test than the spacing of voltage sites in the panel under test. The device may operate in a pass-through mode or in a reflective mode.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.