Tester interconnect system
US5124636A · kind A · utility
20Cited by
5References
7Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Feb 22, 1991 |
| Grant date | Jun 23, 1992 |
| Priority date | — |
| Expiry date | Feb 22, 2011 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/2834
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An automatic circuit tester (10) includes a scanner bus (50) that includes series of signal-path links (70A-H, 72A-H) and connectors (51) into which scanner boards (46, 47) are plugged. Each scanner board includes switches (74A-H, 76A-H, and 78A-H) that in different states can (i) connect together the links on opposite sides of the scanner board so as to forward signals along the link sequence and (ii) connect the link on one side to an instrument (18) or system pin (24) while isolating the link on the other side from the first link and the instrument or system pin.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.