Patent · US Expired

Automatic circuit tester employing a three-dimensional switch-matrix layout

US5124638A · kind A · utility

19Cited by
7References
16Claims
0Family size

Assignee

Inventor

Key dates

Filing dateFeb 22, 1991
Grant dateJun 23, 1992
Priority date
Expiry dateFeb 22, 2011

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01R31/2834
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

An automatic circuit tester (10) employs a scanner (20) embodied in a group of interconnected main scanner boards (46, 47) that provide switching by means of mechanical relays. In order to provide a cross-point matrix and structure without unacceptable stub lengths, the relays are mounted on auxiliary boards (114) that extend transversely from the surface of each main board (46, 47). The main scanner boards plug into a scanner bus (50) in such a manner as to permit them to connect or disconnect adjacent links (70A-H, 72A-H) in sequences of links in the scanner bus (50).

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.