Analogue probe calibration
US5125261A · kind A · utility
Assignee
Inventor
Key dates
| Filing date | May 28, 1991 |
| Grant date | Jun 30, 1992 |
| Priority date | — |
| Expiry date | May 28, 2011 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01B3/30
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Disclosed is a method of obtaining data to determine a rotation matrix R, for rotating the axes (x,y,z) of an analogue probe coordinate system (PCS) onto the axes (X,Y,Z) of a machine coordinate system (MCS). The head (14) of the machine is driven to bring a measuring tip (16) of a stylus (12) supported by the probe for movement relative to the head (14) into engagement with a kinematic location (20). With the tip (16) fixed in the location (20) the head is then moved to six different locations. The coordinate positions of the head (14) in the machine coordinate system (MCS), and the stylus (12) in the probe coordinate system are used to set up six simultaneous equations and thus determine the rotation matrix R.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.