Method and apparatus for circuit board testing with controlled backdrive stress
US5127009A · kind A · utility
Assignee
Inventor
Key dates
| Filing date | Aug 29, 1989 |
| Grant date | Jun 30, 1992 |
| Priority date | — |
| Expiry date | Aug 29, 2009 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/3004
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An automated circuit board testing system, for performing in-circuit, functional or cluster tests, takes backdrive stress into account in selecting appropriate isolation methods for digital devices during the design of the test protocol. In other words, the design of the test includes an analysis of the circuit board and its components, and of the available methods to isolate the device- or function-under-test from the rest of the circuit board. The analysis includes a calculation of stress currents on upstream components resulting from backdriving, and a selection of methods from those available which will produce stress currents below a pre-selected level. In another aspect of the invention, the safe maximum run-time for the test using the available methods is computed.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.