Patent · US Expired

Integrated optical precision measuring device

US5127733A · kind A · utility

10Cited by
9References
19Claims
0Family size

Assignee

Inventor

Key dates

Filing dateMay 25, 1990
Grant dateJul 7, 1992
Priority date
Expiry dateMay 25, 2010

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG02B6/34
  • WIPO fieldOptics
  • WIPO sectorInstruments

Abstract

A photoelectric measuring device for measuring the relative position between two objects utilizing interfering lightwave patterns is provided. Two diffraction gratings having an equal grid constants are provided to perpendicularly impinge beam bundles into circular coupling-in gratings of the integrated optical circuit. In addition, an integrated light source may be coupled-out of the integrated optical circuit.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.