Michael Allgauer
8Patents
6h-index
11Co-inventors
56Inventor score
Filing activity: May 25, 1990 → Jul 31, 2002
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US5424833A | Interferential linear and angular displacement apparatus having scanning and scale grating respectively greater than and less than the source wavelength | Physics | 19 | Expired |
| US6445456B2 | Photoelectric position measuring device | Physics | 14 | Expired |
| US5271078A | Device for coupling and/or decoupling beams of light, with an integrated optical component | Physics | 12 | Expired |
| US5786931A | Phase grating and method of producing phase grating | Emerging Cross-Sectional Technologies | 12 | Expired |
| US5127733A | Integrated optical precision measuring device | Physics | 10 | Expired |
| US5187545A | Integrated optical position measuring device and method with reference and measurement signals | Physics | 9 | Expired |
| US5963330A | Optical position measuring device | Electricity | 2 | Expired |
| US6800404B2 | Method for producing a self-supporting electron-optical transparent structure, and structure produced in accordance with the method | Electricity | 0 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.