Patent · US Expired

Process for producing a stacked capacitor of a dram cell

US5135883A · kind A · utility

48Cited by
3References
14Claims
0Family size

Assignee

Inventors

Key dates

Filing dateSep 14, 1990
Grant dateAug 4, 1992
Priority date
Expiry dateSep 14, 2010

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH10D1/714

Abstract

A stacked capacitor of the fin-like structure is provided wherein the plurality of polysilicon layers constituting the storage electrode are connected with each other in the sawtooth-like manner to overcome the structural instability of the fin-like structure. The polysilicon layers constituting the storage electrode are extended overlaying each other, so that the capacity of the capacitor in a highly integrated DRAM may be increased without increasing the area occupied by the capacitor.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.